Automated verification technology using CAD data. - Moritoshi Ando; Hiroshi Oka; Hideo Okada; Yorihiro Sakashita; Nobumi Shibutani (Syst. Comput. Jpn., 1999)

An Internet-based Melanoma Diagnostic System - Toward the Practical Application. - Hitoshi Iyatomi; Hiroshi Oka; Masahiro Hashimoto; Masaru Tanaka; Koichi Ogawa (CIBCB, 2005)

Automatic Identification of Shot Body Region from Clinical Photographies. - Hitoshi Iyatomi; Hiroshi Oka; Masaru Tanaka; Koichi Ogawa (AIPR, 2006)

An improved Internet-based melanoma screening system with dermatologist-like tumor area extraction algorithm. - Hitoshi Iyatomi; Hiroshi Oka; M. Emre Celebi 001; Masahiro Hashimoto; Masafumi Hagiwara; Masaru Tanaka; Koichi Ogawa (Comput. Medical Imaging Graph., 2008)

Analysis of charge-to-hot-carrier degradation in Ge pFinFETs. - Wataru Mizubayashi; Hiroshi Oka; Koichi Fukuda; Yuki Ishikawa; Kazuhiko Endo (IRPS, 2020)

Buried nanomagnet realizing high-speed/low-variability silicon spin qubits: implementable in error-correctable large-scale quantum computers. - Shota Iizuka; Kimihiko Kato; Atsushi Yagishita; Hidehiro Asai; Tetsuya Ueda; Hiroshi Oka; Junichi Hattori; Tsutomu Ikegami; Koichi Fukuda; Takahiro Mori (VLSI Circuits, 2021)

Effect of Conduction Band Edge States on Coulomb-Limiting Electron Mobility in Cryogenic MOSFET Operation. - Hiroshi Oka; Takumi Inaba; Shota Iizuka; Hidehiro Asai; Kimihiko Kato; Takahiro Mori (VLSI Technology and Circuits, 2022)

Determining the low-frequency noise source in cryogenic operation of short-channel bulk MOSFETs. - Takumi Inaba; Hiroshi Oka; Hidehiro Asai; Hiroshi Fuketa; Shota Iizuka; Kimihiko Kato; Shunsuke Shitakata; Koichi Fukuda; Takahiro Mori (VLSI Technology and Circuits, 2023)

Origin of Low-Frequency Noise in Si n-MOSFET at Cryogenic Temperatures: The Effect of Interface Quality. - Hiroshi Oka; Takumi Inaba; Shunsuke Shitakata; Kimihiko Kato; Shota Iizuka; Hidehiro Asai; Hiroshi Fuketa; Takahiro Mori (IEEE Access, 2023)

Occurrence and Mitigation of Hot Carrier Degradation in Cryogenic MOSFET Operation. - Shunsuke Shitakata; Hiroshi Oka; Kimihiko Kato; Takumi Inaba; Shota Iizuka; Hidehiro Asai; Takahiro Mori (DRC, 2024)

Temperature Dependent Variations of Low-Frequency Noise Sources in Cryogenic Short-Channel Bulk MOSFETs. - Takumi Inaba; Hiroshi Oka; Hidehiro Asai; Hiroshi Fuketa; Shota Iizuka; Kimihiko Kato; Shunsuke Shitakata; Koichi Fukuda; Takahiro Mori (IEEE Access, 2024)

A Study on the Origin of MOSFET Random Telegraph Noise Under Strong Inversion at Cryogenic Temperatures. - Kiyoshi Takeuchi; Tomoko Mizutani; Takuya Saraya; Hiroshi Oka; Takahiro Mori; Shinichi Takagi; Masaharu Kobayashi; Toshiro Hiramoto (IRPS, 2025)