Effect of High Frequency Noise Current Sources on Noise Figure for Sub-50 nm Node MOSFETs. - Hiroshi Shimomura; Kuniyuki Kakushima; Hiroshi Iwai (IEICE Trans. Electron., 2010)

Equivalent Noise Temperature Representation for Scaled MOSFETs. - Hiroshi Shimomura; Kuniyuki Kakushima; Hiroshi Iwai (IEICE Trans. Electron., 2010)