A Hierarchical Classification Method for US Bank-Notes. - Tatsuhiko Kagehiro; Hiroto Nagayoshi; Hiroshi Sako (IEICE Trans. Inf. Syst., 2006)

Simultaneous Estimation of Super-Resolved Image and 3D Information using Multiple Stereo-Pair Images. - Kazuto Kimura; Takayuki Nagai; Hiroto Nagayoshi; Hiroshi Sako (ICIP (5), 2007)

Kanji Character Detection from Complex Real Scene Images based on Character Properties. - Lianli Xu; Hiroto Nagayoshi; Hiroshi Sako (Document Analysis Systems, 2008)

A Display Technique for Preventing Electromagnetic Eavesdropping Using Color Mixture Characteristic of Human Eyes. - Takashi Watanabe; Hiroto Nagayoshi; Hiroshi Sako (Information Hiding, 2008)

Detection of a Hand Holding a Cellular Phone Using Multiple Image Features. - Hiroto Nagayoshi; Takashi Watanabe; Tatsuhiko Kagehiro; Hisao Ogata; Tsukasa Yasue; Hiroshi Sako (ICIAP, 2009)

Detection of Fundus Lesions Using Classifier Selection. - Hiroto Nagayoshi; Yoshitaka Hiramatsu; Hiroshi Sako; Mitsutoshi Himaga; Satoshi Kato (IEICE Trans. Inf. Syst., 2009)

Color Drop-Out Binarization Method for Document Images with Color Shift. - Minenobu Seki; Eisuke Asano; Tsukasa Yasue; Hiroto Nagayoshi; Hiroshi Shinjo; Takeshi Nagasaki (ICDAR, 2013)

Estimating Camera Pose Using Trajectories Generated by Pan-Tilt Motion. - Hiroto Nagayoshi; Marc Pollefeys (3DV, 2014)

Hands-Free AWork Support System Monitoring Work Progress with Point-cloud Data Processing. - Hirohiko Sagawa; Hiroto Nagayoshi; Harumi Kiyomizu; Tsuneya Kurihara (ISMAR, 2015)

Deployment Conscious Automatic Surface Crack Detection. - Yuki Inoue; Hiroto Nagayoshi (WACV, 2019)

Crack Detection as a Weakly-Supervised Problem: Towards Achieving Less Annotation-Intensive Crack Detectors. - Yuki Inoue; Hiroto Nagayoshi (ICPR, 2020)

Human-error-potential Estimation based on Wearable Biometric Sensors. - Hiroki Ohashi; Hiroto Nagayoshi (KDIR, 2021)

Weakly-Supervised Crack Detection. - Yuki Inoue; Hiroto Nagayoshi (IEEE Trans. Intell. Transp. Syst., 2023)

Prediction of High-Level Actions from the Sequence of Atomic Actions in Assembly Line Workstations. - Sanjay Kumar Dwivedi; Hiroto Nagayoshi; Hiroki Ohashi (ETFA, 2024)