Adiabatic SRAM with a shared access port using a controlled ground line and step-voltage circuit. - Shunji Nakata; Hirotsugu Suzuki; Ryota Honda; Takahito Kusumoto; Shin'ichiro Mutoh; Hiroshi Makino; Masayuki Miyama; Yoshio Matsuda (ISCAS, 2010)

Reexamination of SRAM Cell Write Margin Definitions in View of Predicting the Distribution. - Hiroshi Makino; Shunji Nakata; Hirotsugu Suzuki; Shin'ichiro Mutoh; Masayuki Miyama; Tsutomu Yoshimura; Shuhei Iwade; Yoshio Matsuda (IEEE Trans. Circuits Syst. II Express Briefs, 2011)

Utilising the normal distribution of the write noise margin to easily predict the SRAM write yield. - Hiroshi Makino; Shunji Nakata; Hirotsugu Suzuki; Shin'ichiro Mutoh; Masayuki Miyama; Tsutomu Yoshimura; Shuhei Iwade; Yoshio Matsuda (IET Circuits Devices Syst., 2012)

WSQF: comprehensive software quality evaluation framework and benchmark based on SQuaRE. - Naohiko Tsuda; Hironori Washizaki; Kiyoshi Honda; Hidenori Nakai; Yoshiaki Fukazawa; Motoei Azuma; Toshihiro Komiyama; Tadashi Nakano; Hirotsugu Suzuki; Sumie Morita; Katsue Kojima; Akiyoshi Hando (ICSE (SEIP), 2019)