Implementation of Memory Tester Consisting of SRAM-Based Reconfigurable Cells. - Yuki Yamagata; Kenichi Ichino; Masayuki Arai; Satoshi Fukumoto; Kazuhiko Iwasaki; Masayuki Satoh; Hiroyuki Itabashi; Takashi Murai; Nobuyuki Otsuka (Asian Test Symposium, 2003)