Universal test complexity of field-programmable gate arrays. - Tomoo Inoue; Hideo Fujiwara; Hiroyuki Michinishi; Tokumi Yokohira; Takuji Okamoto (Asian Test Symposium, 1995)

The Number of Elements in Minimum Test Set for Locally Exhaustive Testing of Combinational Circuits with Five Outputs. - Tokumi Yokohira; Toshimi Shimizu; Hiroyuki Michinishi; Yuji Sugiyama; Takuji Okamoto (IEICE Trans. Inf. Syst., 1995)

A Test Methodology for Interconnect Structures of LUT-based FPGAs. - Hiroyuki Michinishi; Tokumi Yokohira; Takuji Okamoto; Tomoo Inoue; Hideo Fujiwara (Asian Test Symposium, 1996)

Testing for the programming circuit of LUT-based FPGAs. - Hiroyuki Michinishi; Tokumi Yokohira; Takuji Okamoto; Tomoo Inoue; Hideo Fujiwara (Asian Test Symposium, 1997)

CMOS Floating Gate Defect Detection Using I DDQ Test with DC Power Supply. - Hiroyuki Michinishi; Tokumi Yokohira; Takuji Okamoto; Toshifumi Kobayashi; Tsutomu Hondo (Asian Test Symposium, 2002)

Improvement of Detectability for CMOS Floating Gate Defects in Supply Current Test. - Hiroyuki Michinishi; Tokumi Yokohira; Takuji Okamoto; Toshifumi Kobayashi; Tsutomu Hondo (Asian Test Symposium, 2003)

CMOS Floating Gate Defect Detection Using Supply Current Test with DC Power Supply Superposed by AC Component. - Hiroyuki Michinishi; Tokumi Yokohira; Takuji Okamoto; Toshifumi Kobayashi; Tsutomu Hondo (IEICE Trans. Inf. Syst., 2004)

Model analysis of coronary hemodynamics incorporating autoregulation. - Mitsuyasu Kagiyama; Hiroyuki Michinishi; Hiroto Kagotani; Takuji Okamoto; Yasuo Ogasawara; Fumihiko Kajiya (Syst. Comput. Jpn., 2004)

Detection of CMOS Open Node Defects by Frequency Analysis. - Hiroyuki Michinishi; Tokumi Yokohira; Takuji Okamoto; Toshifumi Kobayashi; Tsutomu Hondo (IEICE Trans. Inf. Syst., 2007)