Carrier separation analysis for clarifying carrier conduction and degradation mechanisms in high-k stack gate dielectrics. - Wataru Mizubayashi; Naoki Yasuda; Kenji Okada; Hiroyuki Ota; Hirokazu Hisamatsu; Kunihiko Iwamoto; Koji Tominaga; Katsuhiko Yamamoto; Tsuyoshi Horikawa; Toshihide Nabatame (Microelectron. Reliab., 2005)

Tech-note: Strain-based User Interface Using a Wooden Balance Beam. - Sho Amano; Makoto Iida; Takeshi Naemura; Hiroyuki Ota (3DUI, 2008)

Analysis of a Multi-Oscillated Current Resonant Type DC-DC Converter. - Osamu Matsuo; Hirofumi Matsuo; Yoichi Ishizuka; Hiroyuki Ota (IEICE Trans. Commun., 2008)

Two-step annealing effects on ultrathin EOT higher-k (k = 40) ALD-HfO2 gate stacks. - Yukinori Morita; Shinji Migita; Wataru Mizubayashi; Meishoku Masahara; Hiroyuki Ota (ESSDERC, 2012)

Guidelines for symmetric threshold voltage in tunnel FinFETs with single and dual metal gate electrodes. - Wataru Mizubayashi; Koichi Fukuda; Takahiro Mori; Kazuhiko Endo; Yongxun Liu; Takashi Matsukawa; Shin-ichi O'Uchi; Yuki Ishikawa; Shinji Migita; Yukinori Morita; Akihito Tanabe; Junichi Tsukada; et al. (ESSDERC, 2013)

Performance limit of parallel electric field tunnel FET and improvement by modified gate and channel configurations. - Yukinori Morita; Takahiro Mori; Shinji Migita; Wataru Mizubayashi; Akihito Tanabe; Koichi Fukuda; Takashi Matsukawa; Kazuhiko Endo; Shin-ichi O'Uchi; Yongxun Liu; Meishoku Masahara; Hiroyuki Ota (ESSDERC, 2013)

Variation behavior of tunnel-FETs originated from dopant concentration at source region and channel edge configuration. - Shinji Migita; Takashi Matsukawa; Takahiro Mori; Koichi Fukuda; Yukinori Morita; Wataru Mizubayashi; Kazuhiko Endo; Yongxun Liu; Shin-ichi O'Uchi; Meishoku Masahara; Hiroyuki Ota (ESSDERC, 2014)

Improvement of epitaxial channel quality on heavily arsenic- and boron-doped Si surfaces and impact on tunnel FET performance. - Yukinori Morita; Takahiro Mori; Shinji Migita; Wataru Mizubayashi; Koichi Fukuda; Takashi Matsukawa; Kazuhiko Endo; Shin-ichi O'Uchi; Yongxun Liu; Meishoku Masahara; Hiroyuki Ota (ESSDERC, 2014)

Small Complexity Classes for Computable Analysis. - Akitoshi Kawamura; Hiroyuki Ota (MFCS (2), 2014)

Computational Complexity of Smooth Differential Equations. - Akitoshi Kawamura; Hiroyuki Ota; Carsten Rösnick; Martin Ziegler 001 (Log. Methods Comput. Sci., 2014)

PBTI for N-type tunnel FinFETs. - Wataru Mizubayashi; Takahiro Mori; Koichi Fukuda; Yongxun Liu; Takashi Matsukawa; Yuki Ishikawa; Kazuhiko Endo; Shin-ichi O'Uchi; Junichi Tsukada; Hiromi Yamauchi; Yukinori Morita; Shinji Migita; et al. (ICICDT, 2015)

Evaluation of Apparent Noise on CT Images Using Moving Average Filters. - Keisuke Fujii 005; Keiichi Nomura; Kuniharu Imai; Yoshihisa Muramatsu; So Tsushima; Hiroyuki Ota (J. Digit. Imaging, 2022)