Degradation analysis and current collapse imaging of AlGaN/GaN HEMTs by measurement of electric field-induced optical second-harmonic generation. - Takashi Katsuno; Takaaki Manaka; Tsuyoshi Ishikawa; Hiroyuki Ueda; Tsutomu Uesugi; Mitsumasa Iwamoto (Microelectron. Reliab., 2014)