Determination of optimal polynomial regression function to decompose on-die systematic and random variations. - Takashi Sato 001; Hiroyuki Ueyama; Noriaki Nakayama; Kazuya Masu (ASP-DAC, 2008)

An Adaptive Test for Parametric Faults Based on Statistical Timing Information. - Michihiro Shintani; Takumi Uezono; Tomoyuki Takahashi; Hiroyuki Ueyama; Takashi Sato 001; Kazumi Hatayama; Takashi Aikyo; Kazuya Masu (Asian Test Symposium, 2009)

Accurate Array-Based Measurement for Subthreshold-Current of MOS Transistors. - Takashi Sato 001; Hiroyuki Ueyama; Noriaki Nakayama; Kazuya Masu (IEEE J. Solid State Circuits, 2009)