Exhaustive and Systematic Accuracy Verification and Enhancement of STI Stress Compact Model for General Realistic Layout Patterns. - Kenta Yamada; Toshiyuki Syo; Hisao Yoshimura; Masaru Ito; Tatsuya Kunikiyo; Toshiki Kanamoto; Shigetaka Kumashiro (IEICE Trans. Electron., 2010)