Redundancy removal and simplification of combinational circuits. - Prem R. Menon; Hitesh Ahuja (VTS, 1992)

Redundancy identification and removal in combinational circuits. - Prem R. Menon; Hitesh Ahuja; Mohan Harihara (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1994)

Intel 386TM EX Embedded Processor IDDQ Testing. - Hitesh Ahuja; Dean Arriens; Ben Schneller; Vandana Verma; Wendy Whitman (ITC, 1995)

Temperature and temporal drift compensation for Al2O3-gate ISFET-based pH sensor using machine learning techniques. - Soumendu Sinha; Rishabh Bhardwaj; Nishad Sahu; Hitesh Ahuja; Rishi Sharma 002; Ravindra Mukhiya (Microelectron. J., 2020)

Machine Learning on FPGA for Robust Si3N4-gate ISFET pH Sensor in Industrial IoT Applications. - Soumendu Sinha; Nishad Sahu; Rishabh Bhardwaj; Aditya Mehta; Hitesh Ahuja (IEEE DataPort, 2022)

High-resolution Extreme-throughput Event-based Cameras using GALS Data-scanning Architecture. - Hitesh Ahuja; Rajkumar Kubendran (ICONS, 2023)