A Simple Method to Measure MTF of Paper and Its Application for Dot Gain Analysis. - Masayuki Ukishima; Hitomi Kaneko; Toshiya Nakaguchi; Norimichi Tsumura; Markku Hauta-Kasari; Jussi Parkkinen; Yoichi Miyake (IEICE Trans. Fundam. Electron. Commun. Comput. Sci., 2009)