Cantilever Type Probe Card for At-Speed Memory Test on Wafer. - Hitoshi Iwai; Atsushi Nakayama; Naoko Itoga; Kotaro Omata (VTS, 2005)

A 65nm low-power embedded DRAM with extended data-retention sleep mode. - Takeshi Nagai; Masaharu Wada; Hitoshi Iwai; Mariko Kaku; Atsushi Suzuki; Tomohisa Takai; Naoko Itoga; Takayuki Miyazaki; Hiroyuki Takenaka; Takehiko Hojo; Shinji Miyano (ISSCC, 2006)

An 833MHz Pseudo-Two-Port Embedded DRAM for Graphics Applications. - Mariko Kaku; Hitoshi Iwai; Takeshi Nagai; Masaharu Wada; Atsushi Suzuki; Tomohisa Takai; Naoko Itoga; Takayuki Miyazaki; Takayuki Iwai; Hiroyuki Takenaka; Takehiko Hojo; Shinji Miyano; et al. (ISSCC, 2008)