Dry etch damage and recovery of gallium indium zinc oxide thin-film transistors with etch-back structures. - Jae-Chul Park; Ho-Nyeon Lee (Displays, 2012)

Analysis of the dependence of indium-gallium-zinc oxide thin-film transistor properties on the gate interface material using a two-stack gate-insulator structure. - Jae-Chul Park; Tae Kwang Park; Ho-Nyeon Lee (Displays, 2015)