Comprehensive Laser Sensitivity Profiling and Data Register Bit-Flips for Cryptographic Fault Attacks in 65 Nm FPGA. - Wei He 015; Jakub Breier; Shivam Bhasin; Dirmanto Jap; Hock Guan Ong; Chee Lip Gan (SPACE, 2016)

Effects of voltage stress on the single event upset (SEU) response of 65 nm flip flop. - Chung Tah Chua; Hock Guan Ong; Kevin Sanchez; Philippe Perdu; Chee Lip Gan (Microelectron. Reliab., 2016)

Extensive Laser Fault Injection Profiling of 65 nm FPGA. - Jakub Breier; Wei He 015; Shivam Bhasin; Dirmanto Jap; Samuel Chef; Hock Guan Ong; Chee Lip Gan (J. Hardw. Syst. Secur., 2017)