A new fault injection method for evaluation of combining SEU and SET effects on circuit reliability. - Kejun Wu; Hoda Pahlevanzadeh; Peng Liu 016; Qiaoyan Yu (ISCAS, 2014)

Systematic analyses for latching probability of single-event transients. - Hoda Pahlevanzadeh; Qiaoyan Yu (ISQED, 2014)

A New Analytical Model of SET Latching Probability for Circuits Experiencing Single- or Multiple-Cycle Single-Event Transients. - Hoda Pahlevanzadeh; Qiaoyan Yu (J. Electron. Test., 2014)

Strengthening SIMON Implementation Against Intelligent Fault Attacks. - Jaya Dofe; Jonathan Frey; Hoda Pahlevanzadeh; Qiaoyan Yu (IEEE Embed. Syst. Lett., 2015)

Assessing CPA resistance of AES with different fault tolerance mechanisms. - Hoda Pahlevanzadeh; Jaya Dofe; Qiaoyan Yu (ASP-DAC, 2016)

A Comprehensive FPGA-Based Assessment on Fault-Resistant AES against Correlation Power Analysis Attack. - Jaya Dofe; Hoda Pahlevanzadeh; Qiaoyan Yu (J. Electron. Test., 2016)