Memory-like Defect Diagnosis for CMOL FPGAs. - Jihye Kim 002; Hayoung Lee; Seokjun Jang; Hogyeong Kim; Sungho Kang 001 (ISOCC, 2020)

Redundancy Analysis Optimization with Clustered Known Solutions for High Speed Repair. - Hayoung Lee; Donghyun Han; Hogyeong Kim; Sungho Kang 001 (ISOCC, 2020)

W-ERA: One-Time Memory Repair with Wafer-Level Early Repair Analysis for Cost Reduction. - Hayoung Lee; Donghyun Han; Hogyeong Kim; Sungho Kang 001 (ITC-Asia, 2020)

Multibank Optimized Redundancy Analysis Using Efficient Fault Collection. - Hogyeong Kim; Hayoung Lee; Donghyun Han; Sungho Kang 001 (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2022)