Impact of Barrier Metal Thickness on SRAM Reliability. - Rakesh Ranjan; Pavitra Ramadevi Perepa; Ki-Don Lee; Hokyung Park; Peter Kim; Ganesh Chakravarthy Yerubandi; Jon Haefner; Caleb Dongkyun Kwon; Minjung Jin; Wenhao Zhou; Hyewon Shim; Shin-Young Chung (IRPS, 2023)

Polarity Dependency of MOL-TDDB in FinFET. - Manisha Sharma; Hokyung Park; Yinghong Zhao; Ki-Don Lee; Liangshan Chen; Joonah Yoon; Rakesh Ranjan; Caleb Dongkyan Kwon; Hyewon Shim; Myungsoo Yeo; Shin-Young Chung; Jon Haefner (IRPS, 2023)

Impacts of Post-Cu CMP Queue Time on Reliability. - Yinghong Zhao; Hokyung Park; Ki-Don Lee; Liangshan Chen; Manisha Sharma; Sugento Huandra; Hanson Mao; Brian Filemyr Smith; Wei Xia; Joonah Yoon; Junehwan Kim; Myungsoo Yeo; et al. (IRPS, 2024)