Hybrid-Verfahren zur Modellierung leistungselektronischer Bauelemente. - Holger Göbel (VDI-Verlag, 1993)

Intermittent-contact scanning capacitance microscopy versus contact mode SCM applied to 2D dopant profiling. - Roland Biberger; Guenther Benstetter; Thomas Schweinböck; Peter Breitschopf; Holger Goebel (Microelectron. Reliab., 2008)

Displacement current sensor for contact and intermittent contact scanning capacitance microscopy. - Roland Biberger; Guenther Benstetter; Holger Goebel (Microelectron. Reliab., 2009)

Intermittent-contact capacitance spectroscopy - A new method for determining C(V) curves with sub-micron lateral resolution. - Roland Biberger; Guenther Benstetter; Holger Goebel; Alexander Hofer (Microelectron. Reliab., 2010)

Quasi-static capacitance-voltage characteristics of pentacene-based metal-oxide-semiconductor structures. - C. Ucurum; Holger Goebel (Microelectron. J., 2013)

Scanning probe microscopy based electrical characterization of thin dielectric and organic semiconductor films. - Alexander Hofer; Roland Biberger; Günther Benstetter; Björn Wilke; Holger Göbel (Microelectron. Reliab., 2013)

Realization of a Platform-Independent Web-Application for Engineering Education. - Henning Siemund; Michael Kracht; Holger Goebel (Int. J. Adv. Corp. Learn., 2015)

Smart education in electrical engineering with S.m.i.L.E-mobile. - Holger Goebel; Henning Siemund; Michael Kracht (EDUCON, 2016)