EM algorithm for one-shot device testing with competing risks under exponential distribution. - Narayanaswamy Balakrishnan 001; Hon Yiu So; Man Ho Ling (Reliab. Eng. Syst. Saf., 2015)

On Box-Muller Transformation and Simulation of Normal Record Data. - Narayanaswamy Balakrishnan 001; Hon Yiu So; Xiaojun Zhu 005 (Commun. Stat. Simul. Comput., 2016)

A Bayesian Approach for One-Shot Device Testing With Exponential Lifetimes Under Competing Risks. - Narayanaswamy Balakrishnan 001; Hon Yiu So; Man Ho Ling (IEEE Trans. Reliab., 2016)

EM Algorithm for One-Shot Device Testing With Competing Risks Under Weibull Distribution. - Narayanaswamy Balakrishnan 001; Hon Yiu So; Man Ho Ling (IEEE Trans. Reliab., 2016)

Likelihood Inference Under Proportional Hazards Model for One-Shot Device Testing. - Man Ho Ling; Hon Yiu So; Narayanaswamy Balakrishnan 001 (IEEE Trans. Reliab., 2016)

Exact predictive likelihood inference for Laplace distribution based on a time-constrained experiment. - Xiaojun Zhu 005; Narayanaswamy Balakrishnan 001; Yiliang Zhou; Hon Yiu So (Commun. Stat. Simul. Comput., 2020)