Automated Detection of Color Non-Uniformity Defects in TFT-LCD. - Hong-Dar Lin; Chih-Hao Chien (IJCNN, 2006)

Computer-Aided Vision System for MURA-Type Defect Inspection in Liquid Crystal Displays. - Hong-Dar Lin; Singa Wang Chiu (PSIVT, 2006)

Computer-Aided Vision System for Surface Blemish Detection of LED Chips. - Hong-Dar Lin; Chung-Yu Chung; Singa Wang Chiu (ICANNGA (2), 2007)

A Wavelet-Based Neural Network Applied to Surface Defect Detection of LED Chips. - Hong-Dar Lin; Chung-Yu Chung (ISNN (2), 2007)

Automated visual inspection of ripple defects using wavelet characteristic based multivariate statistical approach. - Hong-Dar Lin (Image Vis. Comput., 2007)

A note on optimal replenishment policy for imperfect quality EMQ model with rework and backlogging. - Hong-Dar Lin; Yuan-Shyi Peter Chiu; Chia-Kuan Ting (Comput. Math. Appl., 2008)

Tiny surface defect inspection of electronic passive components using discrete cosine transform decomposition and cumulative sum techniques. - Hong-Dar Lin (Image Vis. Comput., 2008)

Automated Industrial Inspection of Light-emitting Diodes Using Computer Vision. - Hong-Dar Lin; Yuan-Shyi Peter Chiu; Wan-Ting Lin (IPCV, 2009)

A hybrid approach based on Hotelling statistics for automated visual inspection of display blemishes in LCD panels. - Yuan-Shyi Peter Chiu; Hong-Dar Lin (Expert Syst. Appl., 2009)

Automated defect inspection of light-emitting diode chips using neural network and statistical approaches. - Hong-Dar Lin (Expert Syst. Appl., 2009)

Automated process adjustments of chip cutting operations using neural network and statistical approaches. - Hong-Dar Lin; Wan-Ting Lin (Expert Syst. Appl., 2009)

Automated Industrial Inspection of LED Chips Using Multivariate Factor Analysis. - Hong-Dar Lin; Chung-Yu Chung; Wan-Ting Lin (IPCV, 2010)

Computational Optimization of Manufacturing Batch Size and Shipment for an Integrated EPQ Model with Scrap. - Yuan-Shyi Peter Chiu; Hong-Dar Lin; Ming-Hon Hwang; Nong Pan (Am. J. Comput. Math., 2011)

Mathematical modeling for solving manufacturing run time problem with defective rate and random machine breakdown. - Yuan-Shyi Peter Chiu; Hong-Dar Lin; Huei-Hsin Chang (Comput. Ind. Eng., 2011)

Flaw detection of domed surfaces in LED packages by machine vision system. - Hong-Dar Lin; Singa Wang Chiu (Expert Syst. Appl., 2011)

Note on "replenishment run time problem with machine breakdown and failure in rework". - Hong-Dar Lin; Yuan-Shyi Peter Chiu (Expert Syst. Appl., 2012)

An innovative blemish detection system for curved LED lenses. - Yuan-Shyi Peter Chiu; Hong-Dar Lin (Expert Syst. Appl., 2013)

A note on "intra-supply chain system with multiple sales locations and quality assurance". - Hong-Dar Lin; Fan-Yun Pai; Singa Wang Chiu (Expert Syst. Appl., 2013)

Corrigendum to 'A note on "Intra-supply chain system with multiple sales locations and quality assurance"' [Experts Systems with Applications 40 (11) (2013) 4730-4732]. - Hong-Dar Lin; Fan-Yun Pai; Singa Wang Chiu (Expert Syst. Appl., 2013)

Advanced Artificial Neural Networks. - Tin-Chih Toly Chen; Cheng-Li Liu; Hong-Dar Lin (Algorithms, 2018)

Incorporating Visual Defect Identification and Determination of Occurrence Side in Touch Panel Quality Inspection. - Hong-Dar Lin; Zi-Ting Qiu; Chou-Hsien Lin (IEEE Access, 2022)

Optical Imaging Deformation Inspection and Quality Level Determination of Multifocal Glasses. - Hong-Dar Lin; Tung-Hsin Lee; Chou-Hsien Lin; Hsin-Chieh Wu (Sensors, 2023)

Optical Panel Inspection Using Explicit Band Gaussian Filtering Methods in Discrete Cosine Domain. - Hong-Dar Lin; Huan-Hua Tsai; Chou-Hsien Lin; Hung-Tso Chang (Sensors, 2023)

Utilizing Deep Learning for Defect Inspection in Hand Tool Assembly. - Hong-Dar Lin; Cheng-Kai Jheng; Chou-Hsien Lin; Hung-Tso Chang (Sensors, 2024)