Unsafe Writing Impacts on the Stateful Memristor Gates. - Xi Zhu; Zhiwei Li 008; Hongchang Long; Haijun Liu 003; Yinan Wang; Hui Xu 010 (ISCAS, 2020)

Implication of unsafe writing on the MAGIC NOR gate. - Xi Zhu; Hongchang Long; Zhiwei Li 008; Jietao Diao; Haijun Liu 003; Nan Li 020; Hui Xu 010 (Microelectron. J., 2020)

Logic Implementation Based on Double Memristors. - Hongchang Long; Jietao Diao; Xi Zhu; Zhiwei Li 008; Haijun Liu 003 (ISCAS, 2021)

Error Detection and Correction Method Toward Fully Memristive Stateful Logic Design. - Zhiwei Li 008; Hongchang Long; Xi Zhu; Yinan Wang; Haijun Liu 003; Qingjiang Li; Nuo Xu; Hui Xu 010 (Adv. Intell. Syst., 2022)