Burnout properties of microwave pulse injected on GaAs PHEMT. - Cunbo Zhang; Jian-de Zhang; Honggang Wang 003; Guangxing Du (Microelectron. Reliab., 2015)

Damage effects on low noise amplifiers with microwave pulses. - Cunbo Zhang; Jian-de Zhang; Honggang Wang 003; Guangxing Du (Microelectron. Reliab., 2016)