A study of the fabrication of v-groove structure in ultra-precision milling. - Sujuan Wang; Sandy To; Xin Chen 005; Hao Wang 048; Hongjian Xia (Int. J. Comput. Integr. Manuf., 2014)

Impact of Loss Model Selection on Power Semiconductor Lifetime Prediction in Electric Vehicles. - Hongjian Xia; Yi Zhang 043; Dao Zhou; Minyou Chen; Wei Lai; Yunhai Wei; Huai Wang (IECON, 2022)

Time-Varying Cumulative Damage Recursive Method for Power Semiconductor Devices. - Wei Lai; Hanrui Li; Hui Li; Minyou Chen; Ran Yao; Hongjian Xia; Renkuai Liu; Anbin Liu (IEEE Trans. Ind. Electron., 2023)

capCNN dataset: capacitor C and ESR condition monitoring dataset using convolution neural network. - Hongjian Xia; Yi Zhang 043 (IEEE DataPort, 2024)