Simulation and experiments of intrinsic bending of multilayer microcantilever for maskless scanning plasma etching. - Li Wen; Hongjiang Zeng; Zheng Yuan; Jiaru Chu; Hai Wang 018 (NEMS, 2011)

Measuring resistivity of silicon nanowire using pseudo-random binary sequence injection. - Tomi Roinila; Hongjiang Zeng; Jarmo Verho; Yu Xiao; Matti Vilkko; Pasi Kallio; Jukka Lekkala; Tie Li; Yuelin Wang (Microelectron. J., 2014)