Efficient Bilevel Source Mask Optimization. - Guojin Chen; Hongquan He; Peng Xu; Hao Geng; Bei Yu 001 (DAC, 2024)

PaLM: Point Cloud and Large Pre-trained Model Catch Mixed-type Wafer Defect Pattern Recognition. - Hongquan He; Guowen Kuang; Qi Sun 002; Hao Geng (DATE, 2024)