Bit-Operation-Based Seed Augmentation for LFSR Reseeding with High Defect Coverage. - Hongxia Fang; Krishnendu Chakrabarty; Rubin A. Parekhji (Asian Test Symposium, 2009)

RT-Level Deviation-Based Grading of Functional Test Sequences. - Hongxia Fang; Krishnendu Chakrabarty; Abhijit Jas; Srinivas Patil; Chandra Tirumurti (VTS, 2009)

Deviation-Based LFSR Reseeding for Test-Data Compression. - Zhanglei Wang; Hongxia Fang; Krishnendu Chakrabarty; Michael Bienek (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2009)

Mimicking of Functional State Space with Structural Tests for the Diagnosis of Board-Level Functional Failures. - Hongxia Fang; Zhiyuan Wang; Xinli Gu; Krishnendu Chakrabarty (Asian Test Symposium, 2010)

RTL DFT Techniques to Enhance Defect Coverage for Functional Test Sequences. - Hongxia Fang; Krishnendu Chakrabarty; Hideo Fujiwara (J. Electron. Test., 2010)

Deterministic test for the reproduction and detection of board-level functional failures. - Hongxia Fang; Zhiyuan Wang; Xinli Gu; Krishnendu Chakrabarty (ASP-DAC, 2011)

Ranking of Suspect Faulty Blocks Using Dataflow Analysis and Dempster-Shafer Theory for the Diagnosis of Board-Level Functional Failures. - Hongxia Fang; Zhiyuan Wang; Xinli Gu; Krishnendu Chakrabarty (ETS, 2011)

Design-for-Testability and Diagnosis Methods to target unmodeled Defects in Integrated Circuits and Multi-Chip Boards. - Hongxia Fang (2011)

Reproduction and Detection of Board-Level Functional Failure. - Hongxia Fang; Krishnendu Chakrabarty; Zhiyuan Wang; Xinli Gu (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2012)

Diagnosis of Board-Level Functional Failures Under Uncertainty Using Dempster-Shafer Theory. - Hongxia Fang; Krishnendu Chakrabarty; Zhiyuan Wang; Xinli Gu (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2012)

Functional Test-Sequence Grading at Register-Transfer Level. - Hongxia Fang; Krishnendu Chakrabarty; Abhijit Jas; Srinivas Patil; Chandra Tirumurti (IEEE Trans. Very Large Scale Integr. Syst., 2012)