A Study of Invalid Programming in 3D QLC NAND Flash Memories. - Hongyang Dang; Xiangyu Yao; Zheng Wan; Qiao Li 001 (HotStorage, 2023)

Midas Touch: Invalid-Data Assisted Reliability and Performance Boost for 3d High-Density Flash. - Qiao Li 001; Hongyang Dang; Zheng Wan; Congming Gao; Min Ye; Jie Zhang 048; Tei-Wei Kuo; Chun Jason Xue (HPCA, 2024)

Reliability Impacts Among Neighboring Wordlines on 3D QLC NAND Flash. - Junlong Zhu; Zheng Wan; Hongyang Dang; Kan Zhong; Min Ye; Qiao Li 001; Chun Jason Xue (NVMSA, 2024)