Perspective of flash memory realized on vertical Si nanowires. - HongYu Yu; Yuan Sun; Navab Singh; Guo-Qiang Lo; Dim-Lee Kwong (Microelectron. Reliab., 2012)

Development of electrostatic decay time intelligent test instrument and software design. - Hui Li; Xiaohua Shi; Kejun Li; HongYu Yu (SNPD, 2016)