Quality assurance in automotive electronics. - Verena Müller; Horst Lewitschnig; Nicoleta Kortik; Werner Kanert (Elektrotech. Informationstechnik, 2011)

Survey of recent advanced statistical models for early life failure probability assessment in semiconductor manufacturing. - Daniel Kurz; Horst Lewitschnig; Jürgen Pilz (WSC, 2014)

Advanced Bayesian Estimation of Weibull Early Life Failure Distributions. - Daniel Kurz; Horst Lewitschnig; Jürgen Pilz (Qual. Reliab. Eng. Int., 2014)

Decision-Theoretical Model for Failures Which are Tackled by Countermeasures. - Daniel Kurz; Horst Lewitschnig; Jürgen Pilz (IEEE Trans. Reliab., 2014)

An advanced area scaling approach for semiconductor burn-in. - Daniel Kurz; Horst Lewitschnig; Jürgen Pilz (Microelectron. Reliab., 2015)

Advances on the Stress Interaction Model. - Horst Lewitschnig (IEEE Trans. Reliab., 2015)

Determination of tolerance limits for the reliability of semiconductor devices using longitudinal data. - Vera Hofer; Johannes Leitner; Horst Lewitschnig; Thomas Nowak (Qual. Reliab. Eng. Int., 2017)

Fractional Failures Sampling - An Alternative to Zero Failures Sampling Plans. - Horst Lewitschnig; Armin Fanzott (IEEE Trans. Reliab., 2019)

Weakness Monitors for Fail-Aware Systems. - Wolfgang Granig; Stefan Jaksic; Horst Lewitschnig; Cristinel Mateis; Dejan Nickovic (FORMATS, 2020)

Monitoring Hierarchical Systems for Safety Assurance. - Franz Wotawa; Horst Lewitschnig (IDC, 2021)

Flexible time reduction method for burn-in of high-quality products. - Daniel Kurz; Horst Lewitschnig; Jürgen Pilz (Qual. Reliab. Eng. Int., 2021)

A Data-driven Condition Monitoring method to predict the Remaining Useful Life of SiC Power Modules for Traction Inverters. - Giovanni Di Nuzzo; Horst Lewitschnig; Marc Tüllmann; Sven Rzepka; Alexander Otto (ICPHM, 2023)

A data-driven modelling framework for predicting the quality of semiconductor devices to support burn-in decisions. - Ibrahim Ahmed 009; Piero Baraldi; Enrico Zio; Horst Lewitschnig (Comput. Ind. Eng., 2025)