Rare event diagnosis by iterative failure region locating and elite learning sample selection. - Hosoon Shin; Sheldon X.-D. Tan; Guoyong Shi; Esteban Tlelo-Cuautle (LATS, 2015)

Statistical rare event analysis using smart sampling and parameter guidance. - Yue Zhao; Hosoon Shin; Hai-Bao Chen; Sheldon X.-D. Tan; Guoyong Shi; Xin Li 001 (SoCC, 2015)

Statistical Rare-Event Analysis and Parameter Guidance by Elite Learning Sample Selection. - Yue Zhao; Taeyoung Kim 001; Hosoon Shin; Sheldon X.-D. Tan; Xin Li 001; Hai-Bao Chen; Hai Wang 002 (ACM Trans. Design Autom. Electr. Syst., 2016)

Optimizing and Addressing Stitch Challenges in High-NA EUV Lithography for Large Die Designs. - Yongchan James Ban; Gangsic Kim; Hosoon Shin (ISOCC, 2024)