A hierarchical defect repair approach for hybrid nano/CMOS memory reliability enhancement. - Mehdi Habibi; Hossein Pourmeidani (Microelectron. Reliab., 2014)

A Range Matching CAM for Hierarchical Defect Tolerance Technique in NRAM Structures. - Hossein Pourmeidani; Mehdi Habibi (CoRR, 2019)

Electrically-Tunable Stochasticity for Spin-based Neuromorphic Circuits: Self-Adjusting to Variation. - Hossein Pourmeidani; Punyashloka Debashis; Zhihong Chen; Ronald F. DeMara; Ramtin Zand (MWSCAS, 2020)

Modular Simulation Framework for Process Variation Analysis of MRAM-based Deep Belief Networks. - Paul Wood; Hossein Pourmeidani; Ronald F. DeMara (CoRR, 2020)

Probabilistic Interpolation Recoder for Energy-Error-Product Efficient DBNs With p-Bit Devices. - Hossein Pourmeidani; Shadi Sheikhfaal; Ramtin Zand; Ronald F. DeMara (IEEE Trans. Emerg. Top. Comput., 2021)