Contact pressure monitoring of press-pack IGBT using ultrasonic reflection coefficient method. - Deshuai Sun; Xiao Wang; Houcai Luo; Dongfang Dai; Xianping Chen; Hui Li (IEICE Electron. Express, 2025)

An investigation of how circuit parameters affect the short-circuit type 2 ruggedness in FS-IGBT. - Jingping Zhang; Houcai Luo; Huan Wu; Bofeng Zheng; Xianping Chen (Microelectron. J., 2025)