Reliability characterization of advanced CMOS image sensor (CIS) with 3D stack and in-pixel DTI. - Younggeun Ji; Jeonghoon Kim; Jungin Kim; Miji Lee; Jaeheon Noh; Taeyoung Jeong; Juhyeon Shin; Junho Kim; Young Heo; Ung Cho; Hyun-Chul Sagong; Junekyun Park; et al. (IRPS, 2018)

ContraCluster: Learning to Classify without Labels by Contrastive Self-Supervision and Prototype-Based Semi-Supervision. - Seongho Joe; Byoungjip Kim; Hoyoung Kang; Kyoungwon Park; Bogun Kim; Jaeseon Park; Joonseok Lee; Youngjune Gwon (ICPR, 2022)

Shuffle & Divide: Contrastive Learning for Long Text. - Joonseok Lee; Seongho Joe; Kyoungwon Park; Bogun Kim; Hoyoung Kang; Jaeseon Park; Youngjune Gwon (ICPR, 2022)

Correcting Negative Bias in Large Language Models through Negative Attention Score Alignment. - Sangwon Yu; Jongyoon Song; Bongkyu Hwang; Hoyoung Kang; Sooah Cho; Junhwa Choi; Seongho Joe; Taehee Lee; Youngjune Gwon; Sungroh Yoon (NAACL (Long Papers), 2025)