A built-in self-test and self-diagnosis scheme for embedded SRAM. - Chih-Wea Wang; Chi-Feng Wu; Jin-Fu Li 001; Cheng-Wen Wu; Tony Teng; Kevin Chiu; Hsiao-Ping Lin (Asian Test Symposium, 2000)

A Hierarchical Test Scheme for System-On-Chip Designs. - Jin-Fu Li 001; Hsin-Jung Huang; Jeng-Bin Chen; Chih-Pin Su; Cheng-Wen Wu; Chuang Cheng; Shao-I Chen; Chi-Yi Hwang; Hsiao-Ping Lin (DATE, 2002)

A Built-in Self-Test Scheme with Diagnostics Support for Embedded SRAM. - Chih-Wea Wang; Chi-Feng Wu; Jin-Fu Li 001; Cheng-Wen Wu; Tony Teng; Kevin Chiu; Hsiao-Ping Lin (J. Electron. Test., 2002)

A Hierarchical Test Methodology for Systems on Chip. - Jin-Fu Li 001; Hsin-Jung Huang; Jeng-Bin Chen; Chih-Pin Su; Cheng-Wen Wu; Chuang Cheng; Shao-I Chen; Chi-Yi Hwang; Hsiao-Ping Lin (IEEE Micro, 2002)

A Lane Departure Warning System with FPGA modular design. - Pei-Yung Hsiao; Jin-Hua Hong; Chia-Chen Hsu; Hsiao-Ping Lin; Shih-Shinh Huang (ICVES, 2012)

Self-powered light sensor for simultaneous intensity-and-direction sensing and maximum-energy harvesting with shared photodiodes. - Tai-Haur Kuo; Kuan-Yu Chen; Hsiao-Ping Lin; Shang-Jung Liu (A-SSCC, 2021)