Defect-based Testing for SRAM Address Decoders. - Ho-Jie Hsu; Hsien-Chen Lee; Chun-Yu Shen; Po-Tsang Huang; Shih-Chieh Lin; Yung-Jheng Wang; Ying-Yen Chen; Chien-Yuan Pao; Hung-Yu Lee; Mango Chia-Tso Chao (VTS, 2026)