Fast Search Algorithms for IC Printed Mark Quality Inspection. - Ming-Ching Chang; Hsien-Yei Chen; Chiou-Shann Fuh (MVA, 1998)

Fast Search Algorithms for Industrial Inspection. - Ming-Ching Chang; Chiou-Shann Fuh; Hsien-Yei Chen (Int. J. Pattern Recognit. Artif. Intell., 2001)