Improved weight assignment for logic switching activity during at-speed test pattern generation. - Meng-Fan Wu; Hsin-Cheih Pan; Teng-Han Wang; Jiun-Lang Huang; Kun-Han Tsai; Wu-Tung Cheng (ASP-DAC, 2010)

A scalable quantitative measure of IR-drop effects for scan pattern generation. - Meng-Fan Wu; Kun-Han Tsai; Wu-Tung Cheng; Hsin-Cheih Pan; Jiun-Lang Huang; Augusli Kifli (ICCAD, 2010)