Electrostatic Discharge Implantation to Improve Machine-Model ESD Robustness of Stacked NMOS in Mixed-Voltage I/O Interface Circuits. - Ming-Dou Ker; Hsin-Chyh Hsu; Jeng-Jie Peng (ISQED, 2003)

ESD protection design for mixed-voltage I/O buffer with substrate-triggered circuit. - Ming-Dou Ker; Hsin-Chyh Hsu (IEEE Trans. Circuits Syst. I Regul. Pap., 2005)

Dummy-Gate Structure to Improve ESD Robustness in a Fully-Salicided 130-nm CMOS Technology without Using Extra Salicide-Blocking Mask. - Hsin-Chyh Hsu; Ming-Dou Ker (ISQED, 2006)