Exploring DRAM organizations for energy-efficient and resilient exascale memories. - Bharan Giridhar; Michael Cieslak; Deepankar Duggal; Ronald G. Dreslinski; Hsing Min Chen; Robert Patti; Betina Hold; Chaitali Chakrabarti; Trevor N. Mudge; David T. Blaauw (SC, 2013)

Improving the Reliability of MLC NAND Flash Memories Through Adaptive Data Refresh and Error Control Coding. - Chengen Yang; Hsing Min Chen; Trevor N. Mudge; Chaitali Chakrabarti (J. Signal Process. Syst., 2014)

A Low Cost Multi-Tiered Approach to Improving the Reliability of Multi-Level Cell Pram. - Chengen Yang; Yunus Emre; Zihan Xu; Hsing Min Chen; Yu Cao 001; Chaitali Chakrabarti (J. Signal Process. Syst., 2014)

E-ECC: Low Power Erasure and Error Correction Schemes for Increasing Reliability of Commodity DRAM Systems. - Hsing Min Chen; Akhil Arunkumar; Carole-Jean Wu; Trevor N. Mudge; Chaitali Chakrabarti (MEMSYS, 2015)

Checkpointing Exascale Memory Systems with Existing Memory Technologies. - Nilmini Abeyratne; Hsing Min Chen; Byoungchan Oh; Ronald G. Dreslinski; Chaitali Chakrabarti; Trevor N. Mudge (MEMSYS, 2016)

RATT-ECC: Rate Adaptive Two-Tiered Error Correction Codes for Reliable 3D Die-Stacked Memory. - Hsing Min Chen; Carole-Jean Wu; Trevor N. Mudge; Chaitali Chakrabarti (ACM Trans. Archit. Code Optim., 2016)

Using Low Cost Erasure and Error Correction Schemes to Improve Reliability of Commodity DRAM Systems. - Hsing Min Chen; Supreet Jeloka; Akhil Arunkumar; David T. Blaauw; Carole-Jean Wu; Trevor N. Mudge; Chaitali Chakrabarti (IEEE Trans. Computers, 2016)

Configurable-ECC: Architecting a Flexible ECC Scheme to Support Different Sized Accesses in High Bandwidth Memory Systems. - Hsing Min Chen; Shin-Ying Lee; Trevor N. Mudge; Carole-Jean Wu; Chaitali Chakrabarti (IEEE Trans. Computers, 2019)