Salvaging chips with caches beyond repair. - Hsunwei Hsiung; Byeongju Cha; Sandeep K. Gupta 001 (DATE, 2012)

Towards systematic roadmaps for networked systems. - Bin Liu 004; Hsunwei Hsiung; Da Cheng; Ramesh Govindan; Sandeep Gupta 001 (HotNets, 2012)

A New March Test for Process-Variation Induced Delay Faults in SRAMs. - Da Cheng; Hsunwei Hsiung; Bin Liu 004; Jianing Chen; Jia Zeng; Ramesh Govindan; Sandeep K. Gupta 001 (Asian Test Symposium, 2013)

Interplay of Failure Rate, Performance, and Test Cost in TCAM under Process Variations. - Hsunwei Hsiung; Da Cheng; Bin Liu 004; Ramesh Govindan; Sandeep K. Gupta 001 (Asian Test Symposium, 2013)

A multi-layered methodology for defect-tolerance of datapath modules in processors. - Hsunwei Hsiung; Sandeep K. Gupta 001 (VTS, 2015)