Reliability analysis for flexible electronics: Case study of integrated a-Si: H TFT scan driver. - Tsung-Ching Huang; Kwang-Ting (Tim) Cheng; Huai-Yuan Tseng; Chen-Pang Kung (ACM J. Emerg. Technol. Comput. Syst., 2008)

High-Speed Printing of Transistors: From Inks to Devices. - Vivek Subramanian; Jialiang Cen; Alejandro de la Fuente Vornbrock; Gerd Grau; Hongki Kang; Rungrot Kitsomboonloha; Daniel Soltman; Huai-Yuan Tseng (Proc. IEEE, 2015)