Power, performance, and area evaluation across 180nm-28nm technology nodes based on benchmark circuits. - Minghui Yin; Zhiqiang Li; Weihua Zhang; Hongwei Liu; Huanhuan Zhou; Yunxia You; Chen Wang (IEICE Electron. Express, 2024)

Virtual_N2_PDK: A Predictive Process Design Kit for 2-nm Nanosheet FET Technology. - Yiying Liu; Minghui Yin; Huanhuan Zhou; Yunxia You; Weihua Zhang; Hongwei Liu; Chen Wang; Yajie Zou; Zhiqiang Li (IEEE Trans. Very Large Scale Integr. Syst., 2025)

Dual-flow feature enhancement network for robust anomaly detection in stainless steel pipe welding. - Runlong Cao; Jianqi Zhang; Yun Shen; Huanhuan Zhou; Peiying Zhou; Guowei Shen; Zhengwen Xia; Ying Zang; Qingshan Liu; Wenjun Hu (Vis. Comput., 2025)