Analog IC Aging-induced Degradation Estimation via Heterogeneous Graph Convolutional Networks. - Tinghuan Chen; Qi Sun 002; Canhui Zhan; Changze Liu; Huatao Yu; Bei Yu 001 (ASP-DAC, 2021)

Deep H-GCN: Fast Analog IC Aging-Induced Degradation Estimation. - Tinghuan Chen; Qi Sun 002; Canhui Zhan; Changze Liu; Huatao Yu; Bei Yu 001 (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2022)

Wages: The Worst Transistor Aging Analysis for Large-scale Analog Integrated Circuits via Domain Generalization. - Tinghuan Chen; Hao Geng; Qi Sun 002; Sanping Wan; Yongsheng Sun; Huatao Yu; Bei Yu 001 (ACM Trans. Design Autom. Electr. Syst., 2024)