Manufacturable 300mm platform solution for Field-Free Switching SOT-MRAM. - Kevin Garello; Farrukh Yasin; Hubert Hody; S. Couet; Laurent Souriau; Shamin H. Sharifi; Johan Swerts; Robert Carpenter; Sidharth Rao; Wonsub Kim; J. Wu; K. K. V. Sethu; et al. (VLSI Circuits, 2019)

Threshold switching in a-Si and a-Ge based MSM selectors and its implications for device reliability. - Taras Ravsher; Shamin H. Sharifi; Andrea Fantini; Hubert Hody; Thomas Witters; Daniele Garbin; Robin Degraeve; Valeri Afanas'ev; Jan Van Houdt; Ludovic Goux; D. Crotti; Gouri Sankar Kar (IMW, 2021)

Device engineering guidelines for performance boost in IGZO front gated TFTs based on defect control. - S. Subhechha; Nouredine Rassoul; Attilio Belmonte; Hubert Hody; Harold Dekkers; Michiel J. van Setten; Adrian Vaisman Chasin; Shamin H. Sharifi; K. Banerjee; H. Puliyalil; Shreya Kundu; M. Pak; et al. (ICICDT, 2022)

Degradation mechanism of amorphous IGZO-based bipolar metal-semiconductor-metal selectors. - Taras Ravsher; Andrea Fantini; Adrian Vaisman Chasin; Shamin H. Sharifi; Hubert Hody; Harold Dekkers; Thomas Witters; Jan Van Houdt; Valeri Afanas'ev; Sebastien Couet; Gouri Sankar Kar (IRPS, 2022)

Enhanced performance and low-power capability of SiGeAsSe-GeSbTe 1S1R phase-change memory operated in bipolar mode. - Taras Ravsher; Daniele Garbin; Andrea Fantini; Robin Degraeve; Sergiu Clima; Gabriele Luca Donadio; Shreya Kundu; Hubert Hody; Wouter Devulder; Jan Van Houdt; Valeri Afanas'ev; Romain Delhougne; et al. (VLSI Technology and Circuits, 2022)

Ultra-low Leakage IGZO-TFTs with Raised Source/Drain for Vt > 0 V and Ion > 30 µA/µm. - S. Subhechha; Nouredine Rassoul; Attilio Belmonte; Hubert Hody; Harold Dekkers; Michiel J. van Setten; Adrian Vaisman Chasin; Shamin H. Sharifi; S. Sutar; L. Magnarin; Umberto Celano; H. Puliyalil; et al. (VLSI Technology and Circuits, 2022)

Spin-orbit torque MRAM for ultrafast cache and neuromorphic computing applications. - Siddharth Rao; Kaiming Cai; Giacomo Talmelli; Nathali Franchina-Vergel; Ward Janssens; Hubert Hody; Farrukh Yasin; Kurt Wostyn; Sebastien Couet (IMW, 2023)

Comprehensive Performance and Reliability Assessment of Se-based Selector-Only Memory. - Taras Ravsher; Robin Degraeve; Daniele Garbin; Sergiu Clima; Andrea Fantini; Gabriele Luca Donadio; Shreya Kundu; Wouter Devulder; Hubert Hody; Goedele Potoms; Jan Van Houdt; Valeri Afanas'ev; et al. (IRPS, 2024)