A 69-V CMOS DC/DC converter for ISDN applications. - A. Koroncai; J. Massoner; Heinz Zitta; Hubert Rothleitner; A. Lechner (IEEE J. Solid State Circuits, 1988)

Novel Solution for the Built-in Gate Oxide Stress Test of LDMOS in Integrated Circuits for Automotive Applications. - Vezio Malandruccolo; Mauro Ciappa; Wolfgang Fichtner; Hubert Rothleitner (ETS, 2009)

A new built-in screening methodology to achieve zero defects in the automotive environment. - Vezio Malandruccolo; Mauro Ciappa; Hubert Rothleitner; Wolfgang Fichtner (Microelectron. Reliab., 2009)

Novel built-in methodology for defect testing of capacitor oxide in SAR analog to digital converters for critical automotive applications. - Vezio Malandruccolo; Mauro Ciappa; Wolfgang Fichtner; Hubert Rothleitner (ETS, 2010)

A new built-in screening methodology for Successive Approximation Register Analog to Digital Converters. - Vezio Malandruccolo; Mauro Ciappa; Hubert Rothleitner; M. Hommel; Wolfgang Fichtner (Microelectron. Reliab., 2010)

A New Built-In Defect-Based Testing Technique to Achieve Zero Defects in the Automotive Environment. - Vezio Malandruccolo; Mauro Ciappa; Hubert Rothleitner; Wolfgang Fichtner (J. Electron. Test., 2011)