In situ crystallisation in ZrO2 thin films during high temperature X-ray diffraction. - Chao Zhao; Gert Roebben; Hugo Bender; Edward Young; S. Haukka; Michel Houssa; Mohamed Naili; Stefan De Gendt; Marc M. Heyns; Omer Van der Biest (Microelectron. Reliab., 2001)

Detection of failure sites by focused ion beam and nano-probing in the interconnect of three-dimensional stacked circuit structures. - Yu Yang; Hugo Bender; Kai Arstila; Bart Swinnen; Bert Verlinden; Ingrid De Wolf (Microelectron. Reliab., 2008)

Reliability of AlGaN/GaN HEMTs: Permanent leakage current increase and output current drop. - Denis Marcon; John Viaene; Paola Favia; Hugo Bender; Xuanwu Kang; Silvia Lenci; Steve Stoffels; Stefaan Decoutere (Microelectron. Reliab., 2012)