Translation of automotive module RF immunity test limits into equivalent IC test limits using S-parameter IC models. - Hugo Pues; Ben Brike; Celina Gazda; Peter Teichmann; Kristof Stijnen; Christian Peeters; André Durier; Dries Vande Ginste (EMC Compo, 2013)

Case study on the differences between EMI resilience of analog ICs against continuous wave, modulated and transient disturbances. - Muhammet Burak Baran; Wim Dehaene; Hugo Pues; Kristof Stijnen (EMC Compo, 2015)