Octal-Site EVM Tests for WLAN Transceivers on "Very" Low-Cost ATE Platforms. - Ganesh Srinivasan; Hui-Chuan Chao; Friedrich Taenzler (ITC, 2008)

Development and empirical verification of an accuracy model for the power down leakage tests. - Jae Woong Jeong; Sule Ozev; Friedrich Taenzler; Hui-Chuan Chao (VTS, 2014)