Identification of Tea Storage Times by Linear Discrimination Analysis and Back-Propagation Neural Network Techniques Based on the Eigenvalues of Principal Components Analysis of E-Nose Sensor Signals. - Hui-Chun Yu; Yongwei Wang; Jun Wang 038 (Sensors, 2009)

Inventory survival analysis for semiconductor memory manufacturing. - Jei-Zheng Wu; Hui-Chun Yu; Chen-Fu Chien 001 (WSC, 2014)

A virtual metrology approach for maintenance compensation to improve yield in semiconductor manufacturing. - Kuo-Yi Lin; Chia-Yu Hsu; Hui-Chun Yu (Int. J. Comput. Intell. Syst., 2014)

Hierarchical indices to detect equipment condition changes with high dimensional data for semiconductor manufacturing. - Hui-Chun Yu; Kuo-Yi Lin; Chen-Fu Chien 001 (J. Intell. Manuf., 2014)

A Novel Route Selection and Resource Allocation Approach to Improve the Efficiency of Manual Material Handling System in 200-mm Wafer Fabs for Industry 3.5. - Chen-Fu Chien 001; Che-Wei Chou; Hui-Chun Yu (IEEE Trans Autom. Sci. Eng., 2016)